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Surface Roughness Measuring

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The Effecttek™ optical inspection system provides non-contact, ultra fast surface microtopography scanning and analysis for a range of automated production processes, with real-time reporting
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Thick Film Circuit Measurements

Hybrid integrated circuits, LTCC and other lamination processes, scan the circuit layer in full, set up automatic measurement engineering, and automatically measure the film thickness, line width, position, etc. of the circuit layer, assist process control, and improve process yield.

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